COSDERMA’s equipment
SCAN ELECTRON MICROSCOPE
Principle
Scanning Electron Microscopy (SEM) is a technique based on the principle of electron-matter interactions. A beam of primary electrons strikes the surface of the sample and creates, in response, secondary electrons which are detected by the device. The quantity of secondary electrons detected is variable according to the flatness of the surface of objects, which makes it possible to construct 3 dimensional images of the sample’s topography.
Resolution
SEM is a very high resolution imaging technique reaching the nanometer range.
Application
Study of the hair cuticle (outer envelope) from a non-invasive sample, before and after treatment.
This technique is only available in our Bordeaux centre.