SCAN ELECTRON MICROSCOPE
- SEM analysis of a hair cuticle';
- Obtained images by SEM before and after hair treatment';
Scanning Electron Microscopy (SEM) is a technique based on the principle of electron-matter interactions. A beam of primary electrons strikes the surface of the sample and creates, in response, secondary electrons which are detected by the device. The quantity of secondary electrons detected is variable according to the flatness of the surface of objects, which makes it possible to construct 3 dimensional images of the sample’s topography.
SEM is a very high resolution imaging technique reaching the nanometer range.
Study of the hair cuticle (outer envelope) from a non-invasive sample, before and after treatment.
This technique is only available in our Bordeaux centre.